• DocumentCode
    3051474
  • Title

    Circuit Response of GaAs MMICs and Bias Networks to Ionizing Radiation Transients

  • Author

    Beall, J.M. ; Anderson, W.T.

  • Author_Institution
    Texas Instruments, Inc. and the Naval Research Laboratory
  • Volume
    3
  • fYear
    1986
  • fDate
    5-9 Oct. 1986
  • Abstract
    Measurements indicate that radiation induced currents in GaAs MMIC microstrip circuitry are the principal cause of a transient upset in performance. Currents were observed at both Schottky and Ohmic contacts, while MIM structures remained insulating.
  • Keywords
    Bonding; Capacitors; FETs; Feedback amplifiers; Feedback circuits; Gallium arsenide; Ionizing radiation; MMICs; Microstrip; Ohmic contacts;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Military Communications Conference - Communications-Computers: Teamed for the 90's, 1986. MILCOM 1986. IEEE
  • Type

    conf

  • DOI
    10.1109/MILCOM.1986.4805827
  • Filename
    4805827
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3051474