DocumentCode :
3051946
Title :
Measuring of emitted photo-electrons from cathode
Author :
Sato, S. ; Kojima, A. ; Iijima, N. ; Sone, M. ; Mitsui, H. ; Isono, H.
Author_Institution :
Musashi Inst. of Technol., Tokyo, Japan
fYear :
1990
fDate :
28-31 Oct 1990
Firstpage :
618
Lastpage :
623
Abstract :
A microchannel plate was used to measure the number of emitted photoelectrons from cathodes of Cu, Fe, and Al. The number of photoelectrons is shown to differ according to wavelength. Also, there is a difference in the number of photoelectrons between samples. Even in sample cathodes of the same material, there is a difference in the number of the photoelectrons. The differences in the number of photoelectrons are ranked as follows: Cu>Fe>Al. The number of photoelectrons changes according to the breakdown treatment. It is noted that it is difficult to change the number of the emitted photoelectrons according to the current of the light source
Keywords :
aluminium; copper; image intensifiers; iron; photocathodes; photoemission; Al; Cu; Fe; breakdown treatment; cathodes; emitted photoelectrons; light source; microchannel plate; Aluminum; Cathodes; Copper; Electric breakdown; Electrodes; Electron emission; Gas insulation; Iron; Light sources; Stress;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1990. Annual Report., Conference on
Conference_Location :
Pocono Manor, PA
Type :
conf
DOI :
10.1109/CEIDP.1990.201406
Filename :
201406
Link To Document :
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