DocumentCode :
3051978
Title :
Partial discharge measurements for spherical cavities within solid dielectric materials under different stress and cavity conditions
Author :
Illias, H.A. ; Chen, G. ; Lewin, P.L.
Author_Institution :
Sch. of Electron. & Comput. Sci., Univ. of Southampton, Southampton, UK
fYear :
2009
fDate :
18-21 Oct. 2009
Firstpage :
388
Lastpage :
391
Abstract :
The measurement of partial discharge is used in the performance assessment of insulation systems of high voltage components. This paper describes the development of a test object consisting of a single spherical cavity within a dielectric material. The test object is used to experimentally study the effect of variable applied frequency, applied voltage magnitude and size on PD activity. The obtained measurement data are analyzed and presented. The variations in the measurement results can be interpreted as changes in cavity parameters that can be used for PD modeling. The obtained data gives more information on how PD activity behaves under different stress conditions and the cavity conditions.
Keywords :
dielectric materials; epoxy insulation; epoxy insulators; insulation testing; partial discharge measurement; plasma diagnostics; stress effects; voids (solid); cavity parameters; discharge frequency; discharge voltage; epoxy resin; high voltage component insulation system assessment; partial discharge activity; partial discharge measurement; partial discharge modeling; solid dielectric material; spherical cavity; stress effect; Dielectric materials; Dielectric measurements; Dielectrics and electrical insulation; Frequency; Materials testing; Partial discharge measurement; Partial discharges; Solids; Stress; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 2009. CEIDP '09. IEEE Conference on
Conference_Location :
Virginia Beach, VA
ISSN :
0084-9162
Print_ISBN :
978-1-4244-4557-8
Electronic_ISBN :
0084-9162
Type :
conf
DOI :
10.1109/CEIDP.2009.5377831
Filename :
5377831
Link To Document :
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