Title :
Study of near-field propagating mode profiles and waveguide structures of optical fibers
Author :
Tsai, Din Ping ; Li, Wen Kai
Author_Institution :
Dept. of Phys., Nat. Chung Cheng Univ., Chia Yi, China
Abstract :
A novel method using SNOM and AFM to study both optical fiber structures and near-field optical intensity profiles at fiber endfaces has been successfully developed. We have demonstrated that this novel technique is able to probe both refractive index distribution and near-field propagating intensity profile of fiber structures simultaneously. Correlations between waveguide structures and near-field propagating modes can be acquired directly from the experimental images.
Keywords :
atomic force microscopy; optical dispersion; optical fibre testing; optical microscopy; refractive index; AFM; SNOM; fiber endfaces; near-field optical intensity profiles; near-field propagating mode profiles; optical fibers; refractive index distribution; waveguide structures; Etching; Optical fiber polarization; Optical fibers; Optical propagation; Optical refraction; Optical saturation; Optical variables control; Optical waveguides; Probes; Refractive index;
Conference_Titel :
Lasers and Electro-Optics Society Annual Meeting, 1996. LEOS 96., IEEE
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-3160-5
DOI :
10.1109/LEOS.1996.565152
