DocumentCode :
305233
Title :
Second-harmonic generation in semiconductors: devices and diagnostics
Author :
Janz, S.
Author_Institution :
Inst. for Microstructural Sci., Nat. Res. Council of Canada, Ottawa, Ont., Canada
Volume :
1
fYear :
1996
fDate :
18-21 Nov. 1996
Firstpage :
152
Abstract :
This presentation will review recent efforts to understand the second-order nonlinearity in bulk semiconductors and quantum wells, and at semiconductor interfaces. Optical second-harmonic generation has found increasing application in semiconductor science and technology in 1980s/1990s. One of the reasons for this is the development of quasi-phase matching techniques, which have revolutionized the field of nonlinear optical frequency mixing. Periodically modulating the optical properties of a material, for example along a waveguide, results in a quasiphase matched (QPM) geometry with SH generation efficiencies approaching that of conventional phase matched geometries.
Keywords :
integrated optics; laser tuning; measurement by laser beam; optical harmonic generation; optical testing; optical waveguides; semiconductor device testing; semiconductor quantum wells; spectroscopy; SH generation efficiencies; bulk semiconductors; conventional phase matched geometries; nonlinear optical frequency mixing; optical properties; optical second-harmonic generation; periodically modulating; quantum wells; quasi-phase matching techniques; quasiphase matched geometry; review; second-harmonic generation; second-order nonlinearity; semiconductor interfaces; semiconductor science; semiconductors; Frequency; Geometrical optics; Materials science and technology; Nonlinear optical devices; Nonlinear optics; Optical materials; Optical mixing; Optical modulation; Optical waveguides; Phase modulation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics Society Annual Meeting, 1996. LEOS 96., IEEE
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-3160-5
Type :
conf
DOI :
10.1109/LEOS.1996.565170
Filename :
565170
Link To Document :
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