Title :
Quantitative theory of enhancement and optimisation of optical nonlinearities in semiconductor quantum wells and superlattices
Author :
Jaros, M. ; Shaw, M.J.
Author_Institution :
Dept. of Phys., Newcastle upon Tyne Univ., UK
Abstract :
The nonlinear optical response of semiconductor microstructures in the mid-to-far infrared range of wavelengths is of interest to designers of the next generation of optoelectronic devices because it offers the promise of high speed, integrability, and low energy dissipation. The oscillator strength of optical transitions between adjacent confined states in quantum wells is large and the energy separations span the relevant range of energies. Of particular interest is the relationship between structural properties (well widths, chemical composition, symmetry etc.) and the frequency dependence of the optical response functions which could serve as a basis for optimisation of device structures. The purpose of this study is to outline fresh guidelines for near-resonant enhancement of higher order susceptibilities and second/third harmonic generation.
Keywords :
nonlinear optical susceptibility; optical harmonic generation; optimisation; optoelectronic devices; semiconductor quantum wells; semiconductor superlattices; chemical composition; energy separations; frequency dependence; high speed; higher order susceptibilities; integrability; low energy dissipation; mid-to-far infrared range; near-resonant enhancement; nonlinear optical response; optical harmonic generation; optical nonlinearities; optical response functions; optical transitions; optoelectronic device design; oscillator strength; semiconductor microstructures; semiconductor quantum wells; semiconductor superlattices; structural properties; symmetry; well widths; Energy dissipation; High speed optical techniques; Microstructure; Nonlinear optical devices; Nonlinear optics; Optical design; Optical devices; Optical harmonic generation; Optoelectronic devices; Oscillators;
Conference_Titel :
Lasers and Electro-Optics Society Annual Meeting, 1996. LEOS 96., IEEE
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-3160-5
DOI :
10.1109/LEOS.1996.565171