• DocumentCode
    3052453
  • Title

    Integral equation method for the computation of PD inception voltage in voids

  • Author

    Huang, Yeqin ; Burbank, Kenneth ; Zhang, James Z.

  • Author_Institution
    Dept. of Eng. & Technol., Western Carolina Univ., Cullowhee, NC, USA
  • fYear
    2009
  • fDate
    18-21 Oct. 2009
  • Firstpage
    565
  • Lastpage
    568
  • Abstract
    The presence of voids in insulation materials has deleterious effects on the electrical performance of insulation, and eventually cause breakdown of the insulation. Understanding the physics of partial discharge is a major field of research for the interpretation and identification of insulation defects. The integral equation method presented in this paper provides a general approach to computations of electric stress in dielectrics with voids. The applications of the method are illustrated by computations of the maximum electric stress and inception voltage for voids of various shapes. The method presented in this paper allows us to analyze the electric stress in dielectrics with voids, and thus to make assessment of the risk of insulation breakdown.
  • Keywords
    insulating materials; integral equations; partial discharges; risk analysis; voids (solid); electric insulation breakdown; electric stress computations; inception voltage; insulation defect identification; insulation materials; integral equation method; partial discharge; risk assessment; Dielectric breakdown; Dielectrics and electrical insulation; Electric breakdown; Integral equations; Partial discharges; Physics; Risk analysis; Shape; Stress; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 2009. CEIDP '09. IEEE Conference on
  • Conference_Location
    Virginia Beach, VA
  • ISSN
    0084-9162
  • Print_ISBN
    978-1-4244-4557-8
  • Electronic_ISBN
    0084-9162
  • Type

    conf

  • DOI
    10.1109/CEIDP.2009.5377850
  • Filename
    5377850