DocumentCode
3052453
Title
Integral equation method for the computation of PD inception voltage in voids
Author
Huang, Yeqin ; Burbank, Kenneth ; Zhang, James Z.
Author_Institution
Dept. of Eng. & Technol., Western Carolina Univ., Cullowhee, NC, USA
fYear
2009
fDate
18-21 Oct. 2009
Firstpage
565
Lastpage
568
Abstract
The presence of voids in insulation materials has deleterious effects on the electrical performance of insulation, and eventually cause breakdown of the insulation. Understanding the physics of partial discharge is a major field of research for the interpretation and identification of insulation defects. The integral equation method presented in this paper provides a general approach to computations of electric stress in dielectrics with voids. The applications of the method are illustrated by computations of the maximum electric stress and inception voltage for voids of various shapes. The method presented in this paper allows us to analyze the electric stress in dielectrics with voids, and thus to make assessment of the risk of insulation breakdown.
Keywords
insulating materials; integral equations; partial discharges; risk analysis; voids (solid); electric insulation breakdown; electric stress computations; inception voltage; insulation defect identification; insulation materials; integral equation method; partial discharge; risk assessment; Dielectric breakdown; Dielectrics and electrical insulation; Electric breakdown; Integral equations; Partial discharges; Physics; Risk analysis; Shape; Stress; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation and Dielectric Phenomena, 2009. CEIDP '09. IEEE Conference on
Conference_Location
Virginia Beach, VA
ISSN
0084-9162
Print_ISBN
978-1-4244-4557-8
Electronic_ISBN
0084-9162
Type
conf
DOI
10.1109/CEIDP.2009.5377850
Filename
5377850
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