Title :
AlGaN/InGaN/GaN materials engineering for lasers and optoelectronic applications [MOCVD reactors]
Author :
Woelk, E. ; Schmitz, Darrel ; Strauch, G. ; Wachtendorf, B. ; Jurgensen, H.
Author_Institution :
Laser Inst., Univ. of California, Irvine, CA, USA
Abstract :
To satisfy the demand for material film structures for the fabrication of blue and green light emitting diodes and lasers, we developed metalorganic chemical vapor deposition (MOCVD) reactors for various batch sizes. All these reactors are capable of depositing GaInAlN material films. For the growth of single crystalline semiconductor films with a large band gap, process temperatures in excess of 1000/spl deg/C are required. Such temperatures have not been encountered in MOCVD for optoelectronic films before. Consideration of the nature of the MOCVD process forced a thermal optimization of the reactors in order to prevent unstable chemical compounds-in particular the precursors trimethylindium and tri(m)ethylgallium from suffering premature decomposition. The grown materials were characterized using photoluminescence mapping, spectrometry and sheet resistivity measurements.
Keywords :
III-V semiconductors; aluminium compounds; electrical resistivity; gallium compounds; indium compounds; light emitting diodes; photoluminescence; semiconductor epitaxial layers; semiconductor growth; semiconductor lasers; vapour phase epitaxial growth; 1000 C; AlGaN; GaInAlN material films; GaN; InGaN; MOCVD reactors; blue light emitting diodes; green light emitting diodes; large band gap; lasers; material film structures; materials engineering; metalorganic chemical vapor deposition; optoelectronic applications; photoluminescence mapping; premature decomposition; process temperatures; sheet resistivity; single crystalline semiconductor; spectrometry; thermal optimization; triethylgallium; trimethylgallium; trimethylindium; Aluminum gallium nitride; Chemical lasers; Crystalline materials; Gallium nitride; Inductors; MOCVD; Optical materials; Semiconductor films; Semiconductor materials; Temperature;
Conference_Titel :
Lasers and Electro-Optics Society Annual Meeting, 1996. LEOS 96., IEEE
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-3160-5
DOI :
10.1109/LEOS.1996.565228