Title :
Optical properties of GaInN/GaN heterostructures and quantum wells
Author :
Wetzel, C. ; Takeuchi, T. ; Nitta, S. ; Yamaguchi, S. ; Amano, Hideharu ; Akasaki, I.
Author_Institution :
Dept. of Electr. & Electron. Eng., Meijo Univ., Nagoya, Japan
Abstract :
Photoreflection and photoluminescence spectroscopies have been used to identify details of the electronic bandstructure in GaInN/GaN strained heterostructures and multiple quantum well structures. Franz-Keldysh oscillations in the ternary layers are identified in both systems revealing large piezoelectric fields of 240 kV/cm (x=0.079, thin film) and 0.65 MV/cm (x=0.187). From spatially resolved luminescence a very narrow distribution ΔE=28 meV of the bandgap energy is derived (x=0.187). From the variation of the field with strain a piezoelectric coefficient dPz/dεzz=0.3 C/m 2 is obtained corresponding to e14=0.1 C/m2 and an equilibrium polarization of GaN of Peq=43 mCm 2 is extrapolated in qualitative agreement with recent calculations
Keywords :
III-V semiconductors; energy gap; gallium compounds; indium compounds; photoluminescence; photoreflectance; piezoelectricity; semiconductor heterojunctions; semiconductor quantum wells; Franz-Keldysh oscillations; GaInN-GaN; bandgap energy; electronic bandstructure; equilibrium polarization; multiple quantum well; photoluminescence; photoreflection; piezoelectric coefficient; piezoelectric fields; strained heterostructures; Capacitive sensors; Energy resolution; Gallium nitride; Luminescence; Optical films; Photoluminescence; Photonic band gap; Piezoelectric films; Spatial resolution; Spectroscopy;
Conference_Titel :
Semiconducting and Insulating Materials, 1998. (SIMC-X) Proceedings of the 10th Conference on
Conference_Location :
Berkeley, CA
Print_ISBN :
0-7803-4354-9
DOI :
10.1109/SIM.1998.785115