DocumentCode
3052778
Title
Temperature-Dependence Measurement of Anisotropic Complex Permittivity for Mic Dielectric Substrate
Author
Kobayashi, Y. ; Yu, J.
Author_Institution
Department of Electrical and Electronics Engineering, Saitama University, Japan
Volume
2
fYear
1992
fDate
11-13 Aug. 1992
Firstpage
859
Lastpage
862
Keywords
Anisotropic magnetoresistance; Copper; Dielectric measurements; Dielectric substrates; Electromagnetic heating; Laminates; Microwave integrated circuits; Permittivity measurement; Surface resistance; Temperature measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference, 1992. APMC 92. 1992 Asia-Pacific
Conference_Location
Adelaide, South Australia
Print_ISBN
0-7803-0549-3
Type
conf
DOI
10.1109/APMC.1992.672271
Filename
672271
Link To Document