• DocumentCode
    3052974
  • Title

    Quasi-ballistic transport in nanowire field-effect transistors

  • Author

    Baccarani, Giorgio ; Gnani, Elena ; Gnudi, Antonio ; Reggiani, Susanna

  • Author_Institution
    Dept. of Electron., Univ. of Bologna, Bologna
  • fYear
    2008
  • fDate
    9-11 Sept. 2008
  • Firstpage
    5
  • Lastpage
    8
  • Abstract
    In this work we investigate quasi-ballistic transport in nanowire field-effect transistors (NW-FETs) by addressing the 1D Boltzmann transport equation. First, we find its exact analytical solution for any potential profile within the constraint of dominant elastic scattering. Next, we calculate the I-V characteristics of the NW-FET, which differ from the Landauer expression for the inclusion of a transmission coefficient smaller than one. Our approach provides a methodology for the calculation of the transmission and backscattering coefficients directly from the scattering probabilities. These coefficients turn out to be functions of the ratio between the device length and a suitably-averaged momentum-relaxation distance. One of the main conclusions of the paper is that, so long as inelastic collisions are neglected, the so-called kT-layer plays no role in 1D devices.
  • Keywords
    Boltzmann equation; ballistic transport; field effect transistors; nanowires; Boltzmann transport equation; I-V characteristics; Landauer expression; backscattering coefficient calculation; dominant elastic scattering; inelastic collisions; nanowire field-effect transistors; quasi-ballistic transport; scattering probabilities; suitably-averaged momentum-relaxation distance; transmission coefficient calculation; Backscatter; Boltzmann equation; Distribution functions; FETs; MOSFETs; Monte Carlo methods; Optical scattering; Probability; Schrodinger equation; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation of Semiconductor Processes and Devices, 2008. SISPAD 2008. International Conference on
  • Conference_Location
    Hakone
  • Print_ISBN
    978-1-4244-1753-7
  • Type

    conf

  • DOI
    10.1109/SISPAD.2008.4648223
  • Filename
    4648223