• DocumentCode
    3053011
  • Title

    High field effects on the electrical aging of polyethylene and of polypropylene

  • Author

    Crine, Jean-Pierre

  • Author_Institution
    St-Bruno, QC, J3V 1P6 Canada
  • fYear
    2009
  • fDate
    18-21 Oct. 2009
  • Firstpage
    47
  • Lastpage
    50
  • Abstract
    In this paper, we show that the electrical aging equation for polyethylene and polypropylene under high fields (above 100 kV/mm) require and additional term, which is the strain energy (sometimes called the electromechanical energy). This term becomes significant at high fields when the electromechanical stress thus generated compress the tested sample. From a practical point of view, this means that life could be a bit longer than expected at very high fields. Examples with the two above polymers are shown along with the corresponding calculated activation volume and the strained activation volume. The stress at which the strain energy becomes significant can also be calculated from the mechanical properties of the polymer. This makes the aging equation a little bit more complicated than we expected but it is still possible to relate the fast breakdown measurements with long lasting endurance tests.
  • Keywords
    electric breakdown; electromechanical effects; high field effects; polyethylene insulation; calculated activation volume; electrical aging; electromechanical energy; electromechanical stress; endurance tests; fast breakdown measurements; high field effects; mechanical properties; polyethylene; polymers; polypropylene; strain energy; strained activation volume; Aging; Capacitive sensors; Dielectric constant; Dielectrics and electrical insulation; Electric breakdown; Equations; Polyethylene; Polymers; Stress; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 2009. CEIDP '09. IEEE Conference on
  • Conference_Location
    Virginia Beach, VA
  • ISSN
    0084-9162
  • Print_ISBN
    978-1-4244-4557-8
  • Electronic_ISBN
    0084-9162
  • Type

    conf

  • DOI
    10.1109/CEIDP.2009.5377875
  • Filename
    5377875