Title :
A new built-in IDDQ testing method using programmable BICS
Author :
Maltabas, Samed ; Ekekon, Osman Kubilay ; Margala, Martin
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Massachusetts Lowell, Lowell, MA, USA
Abstract :
The paper presents a novel programmable Built In Current Sensor (BICS) topology in IBM 65 nm CMOS technology. Proposed topology has 2.086 GHz bandwidth and 38.9ps detection time. Moreover, a new built-in IDDQ test flow is proposed. Proposed test flow is applied to a charge pump. The results show 100% fault coverage for the defects that affects the output of the charge pump (CP). 97.87% overall fault coverage is achieved for the same test.
Keywords :
CMOS integrated circuits; charge pump circuits; circuit testing; CMOS technology; IDDQ test flow; built in current sensor; built-in IDDQ testing; charge pump; fault coverage; programmable BICS; Bandwidth; Built-in self-test; CMOS technology; Charge pumps; Circuit faults; Circuit testing; Circuit topology; Paper technology; Phase locked loops; Switches; BICS; BIST; Charge Pump; Current Based Testing; DFT; IDDQ; Phase-Locked Loops; Programmability;
Conference_Titel :
Test Symposium (ETS), 2010 15th IEEE European
Conference_Location :
Praha
Print_ISBN :
978-1-4244-5834-9
Electronic_ISBN :
1530-1877
DOI :
10.1109/ETSYM.2010.5512729
