• DocumentCode
    3053158
  • Title

    Process tomography of coherent state transfer from light polarization to electron spin polarization in a semiconductor

  • Author

    Kosaka, Hideo ; Inagaki, Takahiro ; Mitsumori, Yaeko ; Edamatsu, Keiichi

  • Author_Institution
    Res. Inst. of Electr. Commun., Tohoku Univ., Sendai, Japan
  • fYear
    2013
  • fDate
    June 30 2013-July 4 2013
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    We demonstrate process tomography of coherent state transfer. We estimated process fidelity of the state transfer to be 81% and clarified that the phase-flip error is the major contribution to the fidelity degradation.
  • Keywords
    electron spin polarisation; light coherence; light polarisation; optical tomography; semiconductor quantum wells; coherent state transfer; electron spin polarization; fidelity degradation; light polarization; phase-flip error; process tomography; semiconductor; Coherence; Electron optics; Magnetic fields; Optical polarization; Optical pulses; Probes; Tomography;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics Pacific Rim (CLEO-PR), 2013 Conference on
  • Conference_Location
    Kyoto
  • Type

    conf

  • DOI
    10.1109/CLEOPR.2013.6599947
  • Filename
    6599947
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3053158