Title :
Packaging Challenges for Miniaturized SOT Packages
Author :
Dexin, Zeng ; Song, Hyok J. ; Li, Yang ; Tan, HB ; Qianghua, Pan
Author_Institution :
Leshan Phoenix Semicond. Co. Ltd., Leshan
Abstract :
The paper presents the packaging challenges faced in the development of miniaturized SOT(D)-723 packages. It drew from the two packages development experiences whereby Flat Lead packages of 1.2 mm times 0.8 mm times 0.5 mm (SOT-723) and 1.0 mm times 0.6 mm times 0.5 mm (SOD-723) were successfully developed and introduced commercially. The products are used mainly on hand-held applications where form factor is important consideration. Due to reduced package profile, several packaging solutions were developed: (i) Development of thin wafer sawing process to minimize die crack and back chip defects; (ii) Low stress die attach technology to reduce packaging process stress and enhance die bond integrity; and (iii) Development of special molding compound material and process design to enhance moldability and minimize potential wire sweep problem.
Keywords :
crystal defects; microassembling; semiconductor device packaging; transistors; back chip defects; die bond integrity; die crack defects; flat lead packages; form factor; low stress die attach technology; miniaturized SOT(D)-723 packages; moldability; molding compound material; packaging process stress; process design; thin wafer sawing process; wire sweep problem; Assembly; Bonding; Design for manufacture; Electronics packaging; Manufacturing processes; Process design; Semiconductor device packaging; Stress; Testing; Wire;
Conference_Titel :
Electronics Manufacturing and Technology, 31st International Conference on
Conference_Location :
Petaling Jaya
Print_ISBN :
978-1-4244-0730-9
Electronic_ISBN :
1089-8190
DOI :
10.1109/IEMT.2006.4456424