• DocumentCode
    3053269
  • Title

    Configurable fault-tolerant link for inter-die communication in 3D on-chip networks

  • Author

    Pasca, Vladimir ; Anghel, Lorena ; Rusu, Claudia ; Benabdenbi, Mounir

  • Author_Institution
    TIMA Lab., Grenoble, France
  • fYear
    2010
  • fDate
    24-28 May 2010
  • Firstpage
    258
  • Lastpage
    258
  • Abstract
    In this paper configurable fault tolerant links are proposed for inter-die communication in stacked 3D SoCs. For high TSV fault rates, links degrade their performance by serial data transmission and signal remapping on the defect free wires. The link degradation is limited to a predetermined value, above which the link is considered non-functional.
  • Keywords
    fault tolerance; system-on-chip; three-dimensional integrated circuits; 3D on-chip networks; TSV fault rates; configurable fault-tolerant link; defect free wires; inter-die communication; link degradation; serial data transmission; signal remapping; stacked 3D SoC; Circuit faults; Clocks; Counting circuits; Degradation; Fault tolerance; Integrated circuit interconnections; Manufacturing processes; Network-on-a-chip; Switches; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ETS), 2010 15th IEEE European
  • Conference_Location
    Praha
  • ISSN
    1530-1877
  • Print_ISBN
    978-1-4244-5834-9
  • Electronic_ISBN
    1530-1877
  • Type

    conf

  • DOI
    10.1109/ETSYM.2010.5512735
  • Filename
    5512735