• DocumentCode
    3053286
  • Title

    A shared BIST optimization methodology for memory test

  • Author

    Zaourar, Lilia ; Chentoufi, Jihane Alami ; Kieffer, Yann ; Wenzel, Amaud ; Grandvaux, Frederic

  • Author_Institution
    G-SCOP Lab., Grenoble INP, Grenoble, France
  • fYear
    2010
  • fDate
    24-28 May 2010
  • Firstpage
    255
  • Lastpage
    255
  • Abstract
    We present a methodology, based on genetic algorithms, that optimizes shared heterogeneous Memory BIST architectures with regards to area, testing peak power and test time.
  • Keywords
    built-in self test; genetic algorithms; memory architecture; BIST optimization methodology; built-in self test; genetic algorithm; memory test; shared heterogeneous memory BIST architecture; test time; testing peak power; Built-in self-test; Decision support systems; Optimization methods; Testing; Virtual reality; Bist; memory; optimization; sharing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ETS), 2010 15th IEEE European
  • Conference_Location
    Praha
  • ISSN
    1530-1877
  • Print_ISBN
    978-1-4244-5834-9
  • Electronic_ISBN
    1530-1877
  • Type

    conf

  • DOI
    10.1109/ETSYM.2010.5512736
  • Filename
    5512736
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3053286