Title :
A shared BIST optimization methodology for memory test
Author :
Zaourar, Lilia ; Chentoufi, Jihane Alami ; Kieffer, Yann ; Wenzel, Amaud ; Grandvaux, Frederic
Author_Institution :
G-SCOP Lab., Grenoble INP, Grenoble, France
Abstract :
We present a methodology, based on genetic algorithms, that optimizes shared heterogeneous Memory BIST architectures with regards to area, testing peak power and test time.
Keywords :
built-in self test; genetic algorithms; memory architecture; BIST optimization methodology; built-in self test; genetic algorithm; memory test; shared heterogeneous memory BIST architecture; test time; testing peak power; Built-in self-test; Decision support systems; Optimization methods; Testing; Virtual reality; Bist; memory; optimization; sharing;
Conference_Titel :
Test Symposium (ETS), 2010 15th IEEE European
Conference_Location :
Praha
Print_ISBN :
978-1-4244-5834-9
Electronic_ISBN :
1530-1877
DOI :
10.1109/ETSYM.2010.5512736
