• DocumentCode
    3053288
  • Title

    Improved Reliability of Leadfree Flip Chip Assemblies Using Direct Underfilling by Transfer Molding

  • Author

    Braun, T. ; Wunderle, B. ; Becker, K.-F. ; Koch, M. ; Bader, V. ; Aschenbrenner, R. ; Reichl, H.

  • Author_Institution
    Fraunhofer Inst. for Reliability & Microintegration, Berlin
  • fYear
    2007
  • fDate
    8-10 Nov. 2007
  • Firstpage
    27
  • Lastpage
    34
  • Abstract
    Flip Chip technology has been widely accepted within microelectronics as a technology for maximum miniaturization. Transfer molding is the standard process for a highly reliable encapsulation of leaded and area array packages as BGAs or CSPs. Advanced materials and process developments now allow the use of transfer molding technology for direct underfilling and / or overmolding of Flip Chip assemblies. Existing standard equipment for encapsulation can be used and no additional process step for underfill dispensing or jetting is required. Molded Flip Chips have the potential of high reliability as the low CTE of the flip chip molding compound reduces the thermal mismatch. Trends of the market drive towards SIPs with an integration of different devices. Therefore the highly reliable encapsulation of these hybrid packages with inhomogeneous topography is the goal. For testing the reliability limits and the determination of failure mechanism of molded Flip Chips a test vehicle has been designed at Fraunhofer IZM.
  • Keywords
    ball grid arrays; chip scale packaging; encapsulation; flip-chip devices; integrated circuit reliability; integrated circuit testing; transfer moulding; BGAs; Fraunhofer IZM; area array packages; ball grid arrays; flip chip assemblies overmolding; flip chip molding compound; flip chip molding test vehicle; jetting process; leadfree flip chip assemblies; molded flip chips failure mechanism; package reliability; reliable encapsulation; thermo-mechanical parameters; transfer molding technology; underfill dispensing process; Assembly; Encapsulation; Failure analysis; Flip chip; Microelectronics; Packaging machines; Surfaces; Testing; Transfer molding; Vehicles;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Manufacturing and Technology, 31st International Conference on
  • Conference_Location
    Petaling Jaya
  • ISSN
    1089-8190
  • Print_ISBN
    978-1-4244-0730-9
  • Electronic_ISBN
    1089-8190
  • Type

    conf

  • DOI
    10.1109/IEMT.2006.4456427
  • Filename
    4456427