DocumentCode :
3053443
Title :
Defect Identification by Sensor Network Under Uncertainties
Author :
Furukawa, Tomonari ; Cheng, Jinquan ; Lim, Shen Hin ; Xu, Fei ; Shioya, Ryuji
Author_Institution :
Dept. of Mech. Eng., Virginia Tech, Danville, VA, USA
fYear :
2010
fDate :
4-6 Nov. 2010
Firstpage :
155
Lastpage :
158
Abstract :
This paper presents a theoretical framework for identification of defects by a sensor network under uncertainties. While location of sensors are not known due to their inspection due to limited knowledge on the structure to be inspected, existing inspection methods do not take uncertainties of sensor locations into account for the localization of defects. The proposed theoretical framework formulates the uncertainties of sensor states stemming from both motion and measurement and allows stochastic identification of defects using recursive Beyesian estimation. Multi-sensor belief fusion further allows a network of sensors to jointly identify defects and improve the accuracy of identification. Parametric studies and application to practical defect identification have shown the validity of the proposed framework.
Keywords :
Bayes methods; belief networks; inspection; sensor fusion; stochastic processes; structural engineering; Beyesian estimation; defect identification; multisensor belief fusion; sensor localization; sensor network; sensor states stemming; stochastic identification; Bayesian methods; Equations; Inspection; Mathematical model; Motion measurement; Probabilistic logic; Uncertainty; defect identification; recursive Bayesian estimation; sensor network; sensor uncertainties;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Broadband, Wireless Computing, Communication and Applications (BWCCA), 2010 International Conference on
Conference_Location :
Fukuoka
Print_ISBN :
978-1-4244-8448-5
Electronic_ISBN :
978-0-7695-4236-2
Type :
conf
DOI :
10.1109/BWCCA.2010.64
Filename :
5633825
Link To Document :
بازگشت