DocumentCode
3053701
Title
A complete charge based compact model for silicon nanowire FETs including doping and advanced physical effects
Author
Feng Liu ; Jin He ; Lining Zhang ; Jian Zhang ; Jinhua Hu ; Xing Zhang ; Mansun Chan
Author_Institution
Shenzhen Grad. Sch., Key Lab. of Integrated Microsyst., Peking Univ., Shenzhen
fYear
2008
fDate
9-11 Sept. 2008
Firstpage
157
Lastpage
160
Abstract
A charge-based silicon nanowire FET (SNWT) compact model has been developed. For the first time, inversion charge of SNWT with arbitrary doping concentration is described by an accurate equation including the effects of doping and volume inversion. Analytic drain current, transconductance, output conductance, terminal charges and capacitance are all physically derived and compared with numerical simulation. It shows that the core model is valid for all operation regions and a wide range of physical configuration including channel doping concentrations and geometrical dimensions. Moreover, advanced physical effects have been included in the model self-consistently.
Keywords
field effect transistors; nanowires; numerical analysis; semiconductor doping; semiconductor quantum wires; analytic drain currents; arbitrary doping concentration; channel doping concentrations; charge-based silicon nanowire FET; compact model; doping-advanced physical effects; doping-volume inversion; numerical simulation; silicon nanowire FET; CMOS technology; Doping; FETs; MOSFETs; Poisson equations; Semiconductor device modeling; Semiconductor process modeling; Silicon; Solid modeling; Transconductance; FET; advanced physical effect; compact model; doping; nanowire;
fLanguage
English
Publisher
ieee
Conference_Titel
Simulation of Semiconductor Processes and Devices, 2008. SISPAD 2008. International Conference on
Conference_Location
Hakone
Print_ISBN
978-1-4244-1753-7
Type
conf
DOI
10.1109/SISPAD.2008.4648261
Filename
4648261
Link To Document