DocumentCode :
3053701
Title :
A complete charge based compact model for silicon nanowire FETs including doping and advanced physical effects
Author :
Feng Liu ; Jin He ; Lining Zhang ; Jian Zhang ; Jinhua Hu ; Xing Zhang ; Mansun Chan
Author_Institution :
Shenzhen Grad. Sch., Key Lab. of Integrated Microsyst., Peking Univ., Shenzhen
fYear :
2008
fDate :
9-11 Sept. 2008
Firstpage :
157
Lastpage :
160
Abstract :
A charge-based silicon nanowire FET (SNWT) compact model has been developed. For the first time, inversion charge of SNWT with arbitrary doping concentration is described by an accurate equation including the effects of doping and volume inversion. Analytic drain current, transconductance, output conductance, terminal charges and capacitance are all physically derived and compared with numerical simulation. It shows that the core model is valid for all operation regions and a wide range of physical configuration including channel doping concentrations and geometrical dimensions. Moreover, advanced physical effects have been included in the model self-consistently.
Keywords :
field effect transistors; nanowires; numerical analysis; semiconductor doping; semiconductor quantum wires; analytic drain currents; arbitrary doping concentration; channel doping concentrations; charge-based silicon nanowire FET; compact model; doping-advanced physical effects; doping-volume inversion; numerical simulation; silicon nanowire FET; CMOS technology; Doping; FETs; MOSFETs; Poisson equations; Semiconductor device modeling; Semiconductor process modeling; Silicon; Solid modeling; Transconductance; FET; advanced physical effect; compact model; doping; nanowire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Simulation of Semiconductor Processes and Devices, 2008. SISPAD 2008. International Conference on
Conference_Location :
Hakone
Print_ISBN :
978-1-4244-1753-7
Type :
conf
DOI :
10.1109/SISPAD.2008.4648261
Filename :
4648261
Link To Document :
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