• DocumentCode
    3053893
  • Title

    Microprocessor fault-tolerance via on-the-fly partial reconfiguration

  • Author

    Di Carlo, Stefano ; Miele, Andrea ; Prinetto, Paolo ; Trapanese, Antonio

  • Author_Institution
    Dipt. di Autom. e Inf., Politec. di Torino, Torino, Italy
  • fYear
    2010
  • fDate
    24-28 May 2010
  • Firstpage
    201
  • Lastpage
    206
  • Abstract
    This paper presents a novel approach to exploit FPGA dynamic partial reconfiguration to improve the fault tolerance of complex microprocessor-based systems, with no need to statically reserve area to host redundant components. The proposed method not only improves the survivability of the system by allowing the online replacement of defective key parts of the processor, but also provides performance graceful degradation by executing in software the tasks that were executed in hardware before a fault and the subsequent reconfiguration happened. The advantage of the proposed approach is that thanks to a hardware hypervisor, the CPU is totally unaware of the reconfiguration happening in real-time, and there´s no dependency on the CPU to perform it. As proof of concept a design using this idea has been developed, using the LEON3 open-source processor, synthesized on a Virtex 4 FPGA.
  • Keywords
    fault tolerant computing; field programmable gate arrays; reconfigurable architectures; system-on-chip; LEON3 open-source processor; Virtex 4 FPGA; field programmable gate array; hardware hypervisor; microprocessor fault-tolerance; partial reconfiguration; Circuit faults; Degradation; Electrical fault detection; Error correction; Fault diagnosis; Fault tolerance; Fault tolerant systems; Field programmable gate arrays; Hardware; Microprocessors; fault tolerance; graceful degradation; partial reconfiguration; self-repair architectures;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ETS), 2010 15th IEEE European
  • Conference_Location
    Praha
  • ISSN
    1530-1877
  • Print_ISBN
    978-1-4244-5834-9
  • Electronic_ISBN
    1530-1877
  • Type

    conf

  • DOI
    10.1109/ETSYM.2010.5512759
  • Filename
    5512759