Advances in probe development and calibration procedure enhance material measurements

Key advantages of using the coaxial probe technique for material measurements have been ease-of-use, little to no sample preparation, and broad frequency coverage. However, some limitations include sufficient sample size and flat surface for proper contact. This paper describes the new slim coaxial probe, where its slim design has loosened the requirements of sample size while broadening its frequency coverage to 50 GHz. By combining the new slim probe with the new refresh calibration, material measurements are enhanced because errors due to system drift or cable movement can easily be eliminated each time before a new measurement is made.