DocumentCode
3054022
Title
Test of embedded analog circuits based on a built-in current sensor
Author
Mozuelos, Román ; Lechuga, Yolanda ; Martínez, Mar ; Bracho, Salvador
Author_Institution
Dept. TEISA, Univ. of Cantabria, Santander, Spain
fYear
2010
fDate
24-28 May 2010
Firstpage
164
Lastpage
169
Abstract
This paper presents a test methodology for mixed-signal circuits. The test approach uses a built-in sensor to analyze the dynamic current supply of the circuit under test. This current sensor emphasizes the highest harmonics of the dynamic current of the circuit under test when the current to voltage conversion is done. The goodness of the test method is analyzed first by means of a fault simulation and afterwards through the experimental data obtained from several benchmark circuits.
Keywords
analogue integrated circuits; benchmark testing; sensors; benchmark circuits; built-in current sensor; current to voltage conversion; dynamic current supply; embedded analog circuits testing; fault simulation; Analog circuits; Benchmark testing; Circuit faults; Circuit testing; Current measurement; Current supplies; Integrated circuit measurements; Integrated circuit testing; System testing; Voltage; Built-in current sensor; Design for test; Dynamic current test; Mixed-signal circuit;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium (ETS), 2010 15th IEEE European
Conference_Location
Praha
ISSN
1530-1877
Print_ISBN
978-1-4244-5834-9
Electronic_ISBN
1530-1877
Type
conf
DOI
10.1109/ETSYM.2010.5512765
Filename
5512765
Link To Document