Title :
Test of embedded analog circuits based on a built-in current sensor
Author :
Mozuelos, Román ; Lechuga, Yolanda ; Martínez, Mar ; Bracho, Salvador
Author_Institution :
Dept. TEISA, Univ. of Cantabria, Santander, Spain
Abstract :
This paper presents a test methodology for mixed-signal circuits. The test approach uses a built-in sensor to analyze the dynamic current supply of the circuit under test. This current sensor emphasizes the highest harmonics of the dynamic current of the circuit under test when the current to voltage conversion is done. The goodness of the test method is analyzed first by means of a fault simulation and afterwards through the experimental data obtained from several benchmark circuits.
Keywords :
analogue integrated circuits; benchmark testing; sensors; benchmark circuits; built-in current sensor; current to voltage conversion; dynamic current supply; embedded analog circuits testing; fault simulation; Analog circuits; Benchmark testing; Circuit faults; Circuit testing; Current measurement; Current supplies; Integrated circuit measurements; Integrated circuit testing; System testing; Voltage; Built-in current sensor; Design for test; Dynamic current test; Mixed-signal circuit;
Conference_Titel :
Test Symposium (ETS), 2010 15th IEEE European
Conference_Location :
Praha
Print_ISBN :
978-1-4244-5834-9
Electronic_ISBN :
1530-1877
DOI :
10.1109/ETSYM.2010.5512765
