• DocumentCode
    3054056
  • Title

    Digitally-Assisted Compensation Technique for Timing Skew in ATE Systems

  • Author

    Asami, Koji ; Tateiwa, Takenori ; Kurosawa, Tsuyoshi ; Miyajima, Hiroyuki ; Kobayashi, Haruo

  • Author_Institution
    Advantest Corp., Meiwa, Japan
  • fYear
    2011
  • fDate
    16-18 May 2011
  • Firstpage
    58
  • Lastpage
    63
  • Abstract
    This paper describes timing skew adjustment techniques in ATE systems (such as for timing skew compensation in an interleaved ADC system and an SSB signal generation system) using a digital filter with novel linear phase condition proposed in our ITC2010 paper. A conventional linear phase digital filter is an FIR filter with coefficients of odd- or even -symmetry and whose group delay NTs/2 where N is the number of the Fir filter taps and Ts is the sampling period, its group delay time resolution is Ts/2. We have generalized the linear phase condition, and with our novel linear phase condition, the group delay time resolution can be arbitrary small, and the coefficients are not necessarily odd- or even-symmetric. In this paper we discuss several practical issues for applying our digital filter to timing skew compensation in ATE systems, such as truncation of the infinite number of taps, techniques of using window and DC gain adjustment. We also compare our digital filter with the fractional delay digital filter.
  • Keywords
    FIR filters; analogue-digital conversion; signal generators; ADC system; ATE system; DC gain adjustment; FIR filter tap; ITC2010 paper; SSB signal generation system; digitally-assisted compensation technique; group delay NTs-2; group delay time resolution; linear phase condition; linear phase digital filter; novel linear phase condition; timing skew adjustment technique; timing skew compensation; Band pass filters; Delay; Finite impulse response filter; Gain; Oscillators; ATE; Digital Filter; Digitally-Assisted Analog Technology; Fractional Delay Digital Filter; Linear Phase; Timing Skew;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW), 2011 IEEE 17th International
  • Conference_Location
    Santa Barbara, CA
  • Print_ISBN
    978-1-4577-1144-2
  • Type

    conf

  • DOI
    10.1109/IMS3TW.2011.16
  • Filename
    6132738