• DocumentCode
    3054170
  • Title

    Film Assisted Molding on MEMS Packages

  • Author

    Boschman, Frank

  • Author_Institution
    Boschman Technol. BV, Duiven
  • fYear
    2007
  • fDate
    8-10 Nov. 2007
  • Firstpage
    320
  • Lastpage
    320
  • Abstract
    Summary form only given. The increase of the application of film assisted molding technology confirms the importance of this new encapsulation technology for the semiconductor industry. The introduction of film in the mold has enabled a process technology using standard pellets that addresses the packaging of advanced silicon devices. The new challenge is the encapsulation of MEMS or sensor packages. MEMS packages often need the access to the environment to make its measurements. FAM technology is an enabling material and process technology that addresses the packaging technology in keeping the functional area open during the encapsulation. FAM technology is also the solution for clean room molding. By carefully analyzing the features of the FAM technology it is possible to manufacture economically advanced packages in high volume production, achieving the highest device reliability. The presentation will explore the possibilities and the benefits that FAM can bring to the encapsulation of MEMS packages.
  • Keywords
    electronics industry; encapsulation; micromechanical devices; moulding; FAM technology; MEMS package; Si; clean room molding; device reliability; encapsulation technology; film assisted molding; packaging technology; semiconductor industry; sensor package; Electronics industry; Encapsulation; Environmental economics; Manufacturing; Micromechanical devices; Paper technology; Production; Semiconductor device packaging; Semiconductor films; Silicon devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Manufacturing and Technology, 31st International Conference on
  • Conference_Location
    Petaling Jaya
  • ISSN
    1089-8190
  • Print_ISBN
    978-1-4244-0730-9
  • Electronic_ISBN
    1089-8190
  • Type

    conf

  • DOI
    10.1109/IEMT.2006.4456473
  • Filename
    4456473