DocumentCode :
3054283
Title :
A robust parallel delaunay mesh generation approach suitable for three-dimensional TCAD
Author :
Stimpfl, Franz ; Heinzl, René ; Schwaha, Philipp ; Selberherr, Siegfried
Author_Institution :
Inst. for Microelectron., Tech. Univ. Wien, Wien
fYear :
2008
fDate :
9-11 Sept. 2008
Firstpage :
265
Lastpage :
268
Abstract :
A new approach for mesh generation has been developed to fulfill the requirements of three-dimensional TCAD with respect to a full utilization of the available upcoming computational power of multi-core CPUs. Parallelization and robustness of the meshing algorithm are facilitated by employing a rigorous surface treatment, which not only enforces prescribed quality criteria such as the Delaunay property, but also allows to decouple the subsequent parallel meshing steps. The presented approach is especially applicable for modern TCAD applications through the combination with the constructive solid geometry method, state of the art programming techniques and programming paradigms.
Keywords :
mesh generation; technology CAD (electronics); constructive solid geometry method; multi-core CPU; robust parallel Delaunay mesh generation; three-dimensional TCAD; Computational modeling; Computer simulation; Concurrent computing; Electronic mail; Etching; Mesh generation; Microelectronics; Robustness; TV; Topology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Simulation of Semiconductor Processes and Devices, 2008. SISPAD 2008. International Conference on
Conference_Location :
Hakone
Print_ISBN :
978-1-4244-1753-7
Type :
conf
DOI :
10.1109/SISPAD.2008.4648288
Filename :
4648288
Link To Document :
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