DocumentCode
3054479
Title
Adaptive test directions
Author
Maxwell, Peter
Author_Institution
Aptina Imaging, San Jose, CA, USA
fYear
2010
fDate
24-28 May 2010
Firstpage
12
Lastpage
16
Abstract
This paper describes the development of adaptive test in response to the ever growing need to dynamically and cost effectively tailor IC testing to discriminately manage manufacturing process variations. Various degrees of adoption are presented, together with benefits and examples of it´s use. Finally, challenges for future development are discussed.
Keywords
integrated circuit manufacture; integrated circuit testing; statistical analysis; IC testing; adaptive test; manufacturing process variations; statistical data analysis; Costs; Data analysis; Feedforward systems; Integrated circuit testing; Manufacturing processes; Packaging; Performance evaluation; Production; Statistical analysis; Voltage; real-time analysis; statistical data analysis; test flow; variability;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium (ETS), 2010 15th IEEE European
Conference_Location
Praha
ISSN
1530-1877
Print_ISBN
978-1-4244-5834-9
Electronic_ISBN
1530-1877
Type
conf
DOI
10.1109/ETSYM.2010.5512789
Filename
5512789
Link To Document