Accurate determination of complex dielectric constants by terahertz time domain attenuated total reflection spectroscopy

Author

Hirori, Hideki ; Arikawa, Takashi ; Nagai, Masaya ; Ohtake, Hideyuki ; Yoshida, Makoto ; Tanaka, Koichiro

Author_Institution

Dept. of Phys., Kyoto Univ., Japan

fYear

2004

fDate

27 Sept.-1 Oct. 2004

Firstpage

251

Lastpage

252

Abstract

We have developed a novel technique of time-domain attenuated total reflection spectroscopy in THz frequency region. Complex dielectric constants in InAs, water, methanol and acetone are successfully determined. The advantage of this technique is that it can be used to access samples with various shapes and optical properties without changing the THz optical path.

Keywords

III-V semiconductors; attenuated total reflection; indium compounds; organic compounds; permittivity; submillimetre wave spectra; water; H₂O; InAs; acetone; attenuated total reflection spectroscopy; dielectric constants; methanol; optical properties; terahertz time domain spectroscopy; water; Biomedical optical imaging; Dielectric constant; Dielectric measurements; Electrochemical impedance spectroscopy; Frequency; Geometrical optics; Optical attenuators; Optical pulses; Optical reflection; Optical surface waves;

fLanguage

English

Publisher

ieee

Conference_Titel

Infrared and Millimeter Waves, 2004 and 12th International Conference on Terahertz Electronics, 2004. Conference Digest of the 2004 Joint 29th International Conference on

Print_ISBN

0-7803-8490-3

Type

conf

DOI

10.1109/ICIMW.2004.1422050

Filename

1422050