• DocumentCode
    3054572
  • Title

    Plenary presentations: Keynote: The product complexity and test — How product complexity impacts test industry

  • Author

    Campbell, Michael

  • Author_Institution
    Qualcomm
  • fYear
    2010
  • fDate
    24-28 May 2010
  • Firstpage
    9
  • Lastpage
    9
  • Abstract
    Summary form only given. One of the driving forces behind the semiconductor industry has been Moore´s law. In abstract Moore´s law says the number of transistors per square inch on integrated circuits will double every 18 months. Doubling transistor count in rough approximation doubles complexity. To keep the same cost, yield at the new process node must be similar to the previous node. Further, to maintain the cost of test as a percentage of AUC, then test time per transistor or cost of test per second have to be reduced by 50% in the same time lines. The research and development driven in yield management, tester development, test development and DFT have allowed an ongoing cost profile that allows for economic profile required to sustain semiconductor expansion. This talk will explore both historical and real time issues related to complexity and the test industry.
  • Keywords
    circuit complexity; integrated circuit testing; semiconductor industry; transistors; Moore law; circuit complexity; integrated circuit testing; product complexity; semiconductor industry; test industry; transistor; Automatic testing; Circuit testing; Costs; Design engineering; Design optimization; Engineering management; Foundries; Moore´s Law; Multiaccess communication; Semiconductor device testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ETS), 2010 15th IEEE European
  • Conference_Location
    Praha
  • ISSN
    1530-1877
  • Print_ISBN
    978-1-4244-5834-9
  • Electronic_ISBN
    1530-1877
  • Type

    conf

  • DOI
    10.1109/ETSYM.2010.5512791
  • Filename
    5512791