DocumentCode
3054572
Title
Plenary presentations: Keynote: The product complexity and test — How product complexity impacts test industry
Author
Campbell, Michael
Author_Institution
Qualcomm
fYear
2010
fDate
24-28 May 2010
Firstpage
9
Lastpage
9
Abstract
Summary form only given. One of the driving forces behind the semiconductor industry has been Moore´s law. In abstract Moore´s law says the number of transistors per square inch on integrated circuits will double every 18 months. Doubling transistor count in rough approximation doubles complexity. To keep the same cost, yield at the new process node must be similar to the previous node. Further, to maintain the cost of test as a percentage of AUC, then test time per transistor or cost of test per second have to be reduced by 50% in the same time lines. The research and development driven in yield management, tester development, test development and DFT have allowed an ongoing cost profile that allows for economic profile required to sustain semiconductor expansion. This talk will explore both historical and real time issues related to complexity and the test industry.
Keywords
circuit complexity; integrated circuit testing; semiconductor industry; transistors; Moore law; circuit complexity; integrated circuit testing; product complexity; semiconductor industry; test industry; transistor; Automatic testing; Circuit testing; Costs; Design engineering; Design optimization; Engineering management; Foundries; Moore´s Law; Multiaccess communication; Semiconductor device testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium (ETS), 2010 15th IEEE European
Conference_Location
Praha
ISSN
1530-1877
Print_ISBN
978-1-4244-5834-9
Electronic_ISBN
1530-1877
Type
conf
DOI
10.1109/ETSYM.2010.5512791
Filename
5512791
Link To Document