• DocumentCode
    3054616
  • Title

    Generic State Equation fro Dual Core Test Pattern

  • Author

    Ling, Boey Huey

  • Author_Institution
    Intel Microelectron. (M) Sdn. Bhd., Penang
  • fYear
    2007
  • fDate
    8-10 Nov. 2007
  • Firstpage
    462
  • Lastpage
    468
  • Abstract
    Dual-core multiprocessing designs enable Intel to increase computing performance in an efficient way while keeping the new processor within reasonable power consumption and heat-generation restrictions. State equation is a piece of code that is written in C++. It contains product specific bus decoding logic and understands how to assign data/timing per pin accordingly during test pattern translation. This paper describes the generic design methodology for SE that supports single core, dual-processor testing methodology while remaining extensible enough to support multi-processor design additions in future. This effort has helped enable Intel´s first successful dual core multiprocessing CPU.
  • Keywords
    C++ language; microprocessor chips; C++; Intel; dual core multiprocessing CPU; dual core test pattern; dual-core multiprocessing designs; generic state equation; product specific bus decoding logic; single core dual-processor testing methodology; test pattern translation; Electronic equipment testing; Equations; Logic testing; Manufacturing; Microelectronics; Packaging; Pins; Semiconductor device testing; Test pattern generators; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Manufacturing and Technology, 31st International Conference on
  • Conference_Location
    Petaling Jaya
  • ISSN
    1089-8190
  • Print_ISBN
    978-1-4244-0730-9
  • Electronic_ISBN
    1089-8190
  • Type

    conf

  • DOI
    10.1109/IEMT.2006.4456495
  • Filename
    4456495