Abstract :
The following topics are dealt with: multicore test; RF-Test; fault detection; fault tolerance; delay analysis; resistive bridges; BIST; microprocessor-based systems; and fault diagnosis.
Keywords :
fault diagnosis; integrated circuit testing; BIST; RF testing; delay analysis; fault detection; fault diagnosis; microprocessor-based systems; multicore test; resistive bridges;
Conference_Titel :
Test Symposium (ETS), 2010 15th IEEE European
Conference_Location :
Praha
Print_ISBN :
978-1-4244-5834-9
Electronic_ISBN :
1530-1877
DOI :
10.1109/ETSYM.2010.5512796
