The impact of the breakdown of Ohm´s law on switching delay due to reactive elements connected in series with a micro/nano-resistor

The transient effects in a nano/micro-scale channel are severely affected by the resistance blowup due to sublinear current-voltage characteristics leading to velocity and current saturation. This resistance blow-up effect increases the transit-time delay through the device that decreases as length of the conducting channel is decreased, but always larger than that predicted from the application of Ohm´s law. RC time constant is shown to enhance dramatically while RL time constant decreases considerably over and above the predictions of Ohm´s law.