• DocumentCode
    3054838
  • Title

    Design of embedded passive components in Low-Temperature Cofired Ceramic on Metal (LTCC-M) technology

  • Author

    Fathy, A. ; Pendrick, V. ; Ayers, G. ; Geller, B. ; Narayan, Y. ; Thaler, B. ; Chen, H.D. ; Liberatore, M.J. ; Prokop, J. ; Choi, K.L. ; Swaminathan, M.

  • Author_Institution
    Sarnoff Corp., Princeton, NJ, USA
  • Volume
    3
  • fYear
    1998
  • fDate
    7-12 June 1998
  • Firstpage
    1281
  • Abstract
    This Sarnoff-developed technology combines conventional Low-Temperature Cofired Ceramic (LTCC) technology and a clad metal base to provide constrained sintering, ruggedness, improved thermal path, and complex cavities with metal ground. Constrained sintering leads to almost zero shrinkage in the x-y plane during the firing operation allowing the accurate placement of embedded components such as resistors, capacitors, transmission lines, etc. This paper describes the development of CAD models for the design and analysis of embedded LTCC-M components. Models were verified by fabricating and testing LTCC-M test coupons for resistors, capacitors, and transmission lines. Results were compared with both EM simulation and circuit modeling. These CAD models operate within the industry standard HP Communications Design Suite utilizing its existing library models; an efficient and cost effective approach. Models, test results, range of validity of these models, and design guidelines are presented.
  • Keywords
    UHF integrated circuits; ceramics; circuit CAD; hybrid integrated circuits; integrated circuit design; microwave integrated circuits; thick film capacitors; thick film circuits; thick film resistors; CAD models; HP Communications Design Suite; LTCC-M technology; Sarnoff-developed technology; capacitors; clad metal base; complex cavities; constrained sintering; design guidelines; embedded passive components; low-temperature cofired ceramic on metal; metal ground; resistors; thermal path improvement; transmission lines; Capacitors; Ceramics; Circuit simulation; Circuit testing; Communication industry; Communication standards; Design automation; Distributed parameter circuits; Firing; Resistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 1998 IEEE MTT-S International
  • Conference_Location
    Baltimore, MD, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-4471-5
  • Type

    conf

  • DOI
    10.1109/MWSYM.1998.700608
  • Filename
    700608