• DocumentCode
    3054936
  • Title

    Roadmap challenges - there is more than Moore [integrated system complexity growth]

  • Author

    Van Roosmalen, Alfred J.

  • Author_Institution
    Philips Semicond., Eindhoven, Netherlands
  • fYear
    2004
  • fDate
    2004
  • Firstpage
    3
  • Abstract
    In 1964, Fairchild engineer Gordon E. Moore postulated a bold theorem for exponential growth in the semiconductors industry. He stated ´The complexity for minimum component costs has increased at a rate of roughly a factor of two per year. Certainly over the short term this rate can be expected to continue, if not to increase. Over the longer term, the rate of increase is a bit more uncertain, although there is no reason to believe it will not remain nearly constant for at least 10 years. This paper deals with the challenges emanating from following the roadmap for microelectronics begun by Moore, with the emphasis on the consequences for the field of thermo mechanics. Which is a journey originating from and still very much influenced by the ever-increasing complexity of integrated silicon technologies, better known as system-on-chip. But also a journey into more and more diversified functions, electronic, mechanical and otherwise, integrated in a single product but not necessarily all on one chip, marking the outlines of the heterogeneous playground of system-in-package. While system-on-chip can be considered as more of Moore, system-in-package is really more than Moore. And for the latter, the future has only just begun.
  • Keywords
    integrated circuit packaging; integrated circuits; system-on-chip; microelectronics roadmap; semiconductor complexity increase; semiconductors industry exponential growth; system-in-package; system-on-chip; thermo mechanics; Biological control systems; Biology computing; Circuits; Costs; Educational institutions; Electron microscopy; Microelectronics; Micromachining; Printing; System-on-a-chip;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal and Mechanical Simulation and Experiments in Microelectronics and Microsystems, 2004. EuroSimE 2004. Proceedings of the 5th International Conference on
  • Print_ISBN
    0-7803-8420-2
  • Type

    conf

  • DOI
    10.1109/ESIME.2004.1304012
  • Filename
    1304012