• DocumentCode
    3055042
  • Title

    Precision surface profile measurements by comb-based multi-wavelength interferometry

  • Author

    Minah Choi ; Sangwon Hyun ; Byung Jae Chun ; Seungman Kim ; Seung-Woo Kim ; Young-Jin Kim

  • Author_Institution
    Dept. of Mech. Eng., Korea Adv. Inst. of Sci. & Technol. (KAIST), Daejeon, South Korea
  • fYear
    2013
  • fDate
    June 30 2013-July 4 2013
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Precision measurement of large-stepped surface profiles is demonstrated using the frequency comb of a femtosecond pulse laser. Four optical wavelengths are selected out of the frequency comb to realize the principle of multi-wavelength interferometry with traceability to the Rb atomic clock of time/frequency standard. A large step-height of ~70 μm is exemplarily measured with nanometre precision with the maximum measurable height being extended to tens of mm.
  • Keywords
    atomic clocks; high-speed optical techniques; light interferometry; rubidium; Rb; atomic clock-of-time-frequency standard; comb-based multiwavelength interferometry; femtosecond pulse laser; nanometre precision; surface profile measurements; Measurement by laser beam; Optical interferometry; Optical surface waves; Semiconductor device measurement; Surface waves; Ultrafast optics; Wavelength measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics Pacific Rim (CLEO-PR), 2013 Conference on
  • Conference_Location
    Kyoto
  • Type

    conf

  • DOI
    10.1109/CLEOPR.2013.6600040
  • Filename
    6600040