DocumentCode :
3055066
Title :
Point/line correspondence under 2D projective transformation
Author :
Meer, Peter ; Weiss, Isaac
Author_Institution :
Dept. of Electr. & Comp. Eng., Rutgers Univ., Piscataway, NJ, USA
fYear :
1992
fDate :
30 Aug-3 Sep 1992
Firstpage :
399
Lastpage :
402
Abstract :
The projective correspondence between planar point/line sets is determined using conic invariants. In each set six (4+2) randomly chosen points/lines define two conics to which two absolute projective invariants can be associated. Similar invariant values yield six-tuples matched between the sets. The order of features on a conic is not important and thus the probability of finding a match is maximized. Feature correspondence is recovered with a dynamic programming type analysis of the contingency table derived from the ensemble of matched six-tuples. The algorithm is very sensitive to feature accuracy, raising questions about the straightforward use of conic invariants in recognition of arbitrary objects. The procedures employed, however-affine invariant conic fitting to noisy data,-probabilistic two-stage matching and are of general interest
Keywords :
dynamic programming; pattern recognition; picture processing; 2D projective transformation; absolute projective invariants; affine invariant conic fitting; conic invariants; dynamic programming type analysis; feature correspondence; line correspondence; noisy data; point correspondence; probabilistic two-stage matching; six-tuples; sixtuples; Automation; Computer vision; Dynamic programming; Educational institutions; Motion estimation; Object recognition; Polynomials; Stereo vision; Symmetric matrices; Transmission line matrix methods;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pattern Recognition, 1992. Vol.I. Conference A: Computer Vision and Applications, Proceedings., 11th IAPR International Conference on
Conference_Location :
The Hague
Print_ISBN :
0-8186-2910-X
Type :
conf
DOI :
10.1109/ICPR.1992.201585
Filename :
201585
Link To Document :
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