• DocumentCode
    3055398
  • Title

    Finite element modelling of crack detection tests

  • Author

    Ridout, Stephen ; Dusek, Milos ; Bailey, Chris ; Hunt, Chris

  • Author_Institution
    Centre of Numerical Modelling & Process Anal., Greenwich Univ., London, UK
  • fYear
    2004
  • fDate
    2004
  • Firstpage
    141
  • Lastpage
    146
  • Abstract
    Four non-destructive tests for determining the length of fatigue cracks within the solder joints of a 2512 surface mount resistor are investigated. The sensitivity of the tests is obtained using finite element analysis with some experimental validation. Three of the tests are mechanically based and one is thermally based. The mechanical tests all operate by applying different loads to the PCB and monitoring the strain response at the top of the resistor. The thermal test operates by applying a heat source underneath the PCB, and monitoring the temperature response at the top of the resistor. From the modelling work done, two of these tests have shown to be sensitive to cracks. Some experimental results are presented but further work is required to fully validate the simulation results.
  • Keywords
    crack detection; finite element analysis; mechanical testing; printed circuit testing; resistors; sensitivity analysis; strain measurement; thermal stress cracking; 2512 surface mount resistor solder joints; PCB load testing; crack detection tests; crack sensitivity analysis; fatigue crack length determination; finite element analysis; four-point test; pull test; resistor strain response; resistor temperature response; thermal cycling; thermal testing; Capacitive sensors; Fatigue; Finite element methods; Monitoring; Nondestructive testing; Resistors; Soldering; Surface cracks; Temperature sensors; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal and Mechanical Simulation and Experiments in Microelectronics and Microsystems, 2004. EuroSimE 2004. Proceedings of the 5th International Conference on
  • Print_ISBN
    0-7803-8420-2
  • Type

    conf

  • DOI
    10.1109/ESIME.2004.1304033
  • Filename
    1304033