Title :
A New Method for Extracting Multi-line Parameters Based on RHT and Block Operation
Author :
Zeng, Jie-Xian ; Li, Si-Xin ; Fu, Xiang
Author_Institution :
Key Lab. of Nondestructive Test (Minist. of Educ.), Nanchang Hangkong Univ., Nanchang, China
Abstract :
Straight line is an important descriptor in image analysis. The drawbacks of traditional straight line parameters extracting methods are anal sized, and a novel multi-line parameters extracting method is proposed. Firstly, the image is divided into blocks, and RHT (random Hough transform) is used to detect straight line parameters in each sub-image. Then, global parameters are extracted based on the relationship of parameters between the sub-images and the global image. Comparisons with traditional scheme are presented and the results demonstrating the performance of the proposed method.
Keywords :
Hough transforms; feature extraction; image processing; RHT; block operation; image analysis; multiline parameter extraction; random Hough transform; straight line descriptor; Computer vision; Electronic commerce; Electronic equipment testing; Image converters; Image edge detection; Labeling; Laboratories; Nondestructive testing; Security; Voting; Hough transform; block operation; line extraction; straight-line parameter;
Conference_Titel :
Electronic Commerce and Security, 2009. ISECS '09. Second International Symposium on
Conference_Location :
Nanchang
Print_ISBN :
978-0-7695-3643-9
DOI :
10.1109/ISECS.2009.134
