• DocumentCode
    3056076
  • Title

    Evaluation of the primary and secondary creep of SnPb solder joint using a modified grooved-lap test specimen

  • Author

    Deplanque, S. ; Nüchter, W. ; Wunderle, B. ; Walter, H. ; Michel, B.

  • Author_Institution
    Robert Bosch GmbH, Stuttgart, Germany
  • fYear
    2004
  • fDate
    2004
  • Firstpage
    351
  • Lastpage
    357
  • Abstract
    The time and temperature dependant creep deformation of solder alloys has to be studied to describe material characteristics and failure behaviour, in order to use it for lifetime evaluation by FE-simulations. It is often found in the literature that the material behaviour of eutectic SnPb solder is described considering only secondary creep. As this paper shows, primary creep may not be neglected because of its appearance in the performed characterisation tests and application examples. To study the creep behaviour, the grooved lap geometry described by Reinikainen was used and additionally modified to see crack and cavities in the solder joint using an SAM (scanning acoustic microscope). The test specimen was cyclically loaded for different stress levels and temperatures. Primary and secondary creep was observable under conditions of load reversal. A combined creep law using primary and secondary creep is presented and an example is shown to highlight the relevance of the primary creep.
  • Keywords
    acoustic microscopy; cracks; creep; creep testing; lead alloys; solders; stress analysis; tin alloys; FE-simulations; SAM; SnPb; cavities; combined creep law; grooved-lap test specimen; joint cracking; load reversal; scanning acoustic microscope; solder alloys; solder joint primary creep; solder joint secondary creep; stress load levels; temperature dependant creep deformation; time dependant creep; Acoustic testing; Creep; Geometry; Microscopy; Performance analysis; Performance evaluation; Soldering; Stress; Temperature dependence; Torque;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal and Mechanical Simulation and Experiments in Microelectronics and Microsystems, 2004. EuroSimE 2004. Proceedings of the 5th International Conference on
  • Print_ISBN
    0-7803-8420-2
  • Type

    conf

  • DOI
    10.1109/ESIME.2004.1304063
  • Filename
    1304063