DocumentCode :
3056511
Title :
A mechanics-based strain gage methodology for solder joint reliability assessment
Author :
Mercado, Lei L. ; Girouard, Steven ; Hsieh, George
Author_Institution :
Intel Corp., Chandler, AZ, USA
fYear :
2004
fDate :
2004
Firstpage :
533
Lastpage :
541
Abstract :
It is essential to understand solder joint strains to improve package reliability. However, it is often difficult to measure the true solder joint strains directly. Strain gages have been increasingly used to indicate package mechanical stress levels. One of the most used strain gage locations is on the component side, right next to the package corner. A concern with this location alone is that the strain gages mounted close to the package pick up the local stress concentration near the package edges or corners. In this paper, appropriate strain gage locations are suggested based on mechanics principles and finite element simulation results. The solder joint deformations are determined from strain gage readings at various locations. This paper also proposes a new strain matching criterion. Most original equipment manufacturers (OEMs) have been using maximum principal strain to match stress levels and define strain limits. A problem with maximum principal strain is that it does not indicate the direction along which the maximum bending occurs. Experimental data demonstrates that the new strain criterion has much better correlation to solder joint failure than maximum principal strains in various bend modes. The conclusions apply to any strain gage mounting metrology on packages attached to printed circuit boards (PCBs).
Keywords :
bending; circuit reliability; electronics packaging; failure analysis; finite element analysis; internal stresses; printed circuits; solders; strain gauges; stress analysis; OEM; PCB attached packages; bend modes; component side strain gage location; finite element simulation; local stress concentration; maximum bending direction; maximum principal strain; mechanics-based strain gage methodology; original equipment manufacturers; package corner; package edges; package mechanical stress levels; package reliability; printed circuit boards; solder joint deformations; solder joint failure; solder joint reliability assessment; solder joint strains; strain criterion correlation; strain gage mounting metrology; stress level matching; Assembly; Capacitive sensors; Electric shock; Electronics packaging; Finite element methods; Packaging machines; Postal services; Soldering; Strain measurement; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal and Mechanical Simulation and Experiments in Microelectronics and Microsystems, 2004. EuroSimE 2004. Proceedings of the 5th International Conference on
Print_ISBN :
0-7803-8420-2
Type :
conf
DOI :
10.1109/ESIME.2004.1304088
Filename :
1304088
Link To Document :
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