• DocumentCode
    3056583
  • Title

    Thermal fatigue modelling for SnAgCu and SnPb solder joints

  • Author

    Dudek, Rainer ; Walter, Hans ; Doering, Ralf ; Michel, Bernd

  • Author_Institution
    Fraunhofer Inst. Reliability & Microintegration, Berlin, Germany
  • fYear
    2004
  • fDate
    2004
  • Firstpage
    557
  • Lastpage
    564
  • Abstract
    Thermal fatigue of solder joints is investigated by means of the finite element method (FEM). During the usual thermal cycle regime with relatively slow temperature ramping rates, solder constitutive response is dominated by secondary creep. In the paper secondary creep laws are given for SnPb and SnAgCu solders, based on our own measurements and literature data. These secondary creep behaviours are compared to other data recently published. Additional primary creep terms are introduced in the creep description. To relate calculation results to fatigue life, criteria of Manson-Coffin type are proposed. These empirical laws are based on either the cyclic inelastic strain or dissipated energy. Effects of the choice of different creep laws on the calculated creep strains and energy densities are studied for two standard components on FR-4 board, a ceramic chip resistor (CC) of size 0805 and a plastic ball grid array with 225 I/O (PBGA 225). It is shown that the choice of the creep law, e.g. the inclusion of primary creep, does significantly affect only the results for the PBGA solder balls.
  • Keywords
    assembling; ball grid arrays; copper alloys; creep; fatigue; finite element analysis; integrated circuit modelling; integrated circuit packaging; lead alloys; plastic packaging; resistors; silver alloys; solders; stress analysis; thermal stresses; tin alloys; FEM; FR-4 board; Manson-Coffin type criteria; PBGA solder balls; SnAgCu; SnAgCu solder joints; SnPb; SnPb solder joints; ceramic chip resistor; creep strains; cyclic inelastic strain; dissipated energy; energy densities; fatigue life; finite element method; plastic ball grid array; primary creep terms; secondary creep laws; solder constitutive response; standard components; temperature ramping rates; thermal cycle regime; thermal fatigue modelling; Capacitive sensors; Ceramics; Creep; Electronics packaging; Fatigue; Finite element methods; Plastics; Resistors; Soldering; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal and Mechanical Simulation and Experiments in Microelectronics and Microsystems, 2004. EuroSimE 2004. Proceedings of the 5th International Conference on
  • Print_ISBN
    0-7803-8420-2
  • Type

    conf

  • DOI
    10.1109/ESIME.2004.1304091
  • Filename
    1304091