Title :
Terahertz reflectance spectroscopy in specular and diffuse modes
Author :
Maragkos, N. ; Naftaly, M. ; Foulds, A.P. ; Stringer, M.R. ; Miles, R.E. ; Davies, A. Giles
Author_Institution :
Inst. of Microwaves & Photonics, Leeds Univ., UK
fDate :
27 Sept.-1 Oct. 2004
Abstract :
We describe a terahertz reflection system designed to perform both specular and diffuse reflection measurements and to switch easily between the two configurations. Some results from both types of measurement are shown.
Keywords :
reflection; submillimetre wave measurement; submillimetre wave spectra; diffuse modes; diffuse reflection measurements; specular modes; specular reflection measurements; terahertz reflectance spectroscopy; terahertz reflection system; Mirrors; Optical reflection; Optical surface waves; Performance evaluation; Reflectivity; Refractive index; Rough surfaces; Spectroscopy; Surface roughness; Ultrafast optics;
Conference_Titel :
Infrared and Millimeter Waves, 2004 and 12th International Conference on Terahertz Electronics, 2004. Conference Digest of the 2004 Joint 29th International Conference on
Print_ISBN :
0-7803-8490-3
DOI :
10.1109/ICIMW.2004.1422129
