Title :
SOI vs. bulk for wireless application
Author :
Owzar, A. ; Baykal, Elif ; Felicio, P. ; Zheng, Tongxin ; Stephan, R. ; Helfenstein, M. ; Becker, R.
Author_Institution :
ST-Ericsson, Geneva, Switzerland
Abstract :
This publication includes a comparison between the performance of mixed signal and digital IPs implemented in SOI and bulk technology. The investigated parameter covered all important parameters for benchmarking of wireless application. Based on the extracted parameters for the digital blocks improvement have been achieved by using SOI without having negative impact on AMS parameter.
Keywords :
mixed analogue-digital integrated circuits; silicon-on-insulator; AMS parameter; SOI; bulk technology; digital IP; mixed signal IP; wireless application; Accuracy; Built-in self-test; Gain; Integrated circuits; Signal to noise ratio; Silicon; Wireless communication;
Conference_Titel :
Circuits and Systems (APCCAS), 2012 IEEE Asia Pacific Conference on
Conference_Location :
Kaohsiung
Print_ISBN :
978-1-4577-1728-4
DOI :
10.1109/APCCAS.2012.6419037
