Title :
The enhanced infrared absorption on different types of metal nano-particle films
Author :
Riebe, A.F. ; Fahsold, G. ; Pucci, A.
Author_Institution :
Kirchhoff-Inst. fur Physik, Heidelberg Univ., Germany
fDate :
27 Sept.-1 Oct. 2004
Abstract :
The surface enhanced infrared absorption (SEIRA) of adsorbates on nano-structured metal films is widely exploited in chemistry and biology, but the basic effects are only partially understood. Our IR transmittance studies of thin metal films under ultra-high vacuum (UHV) conditions showed two types of SEIRA lines. The systems investigated were C2H4 and C2H6, respectively, on cold-deposited Cu films, on transparent substrates (MgO, KBr) and on Cu films prepared at room temperature on the same substrates. For the room-temperature films only the IR-active vibrations of the adsorbates give SEIRA lines, which can be explained by interaction of the molecules with the electromagnetic field. On cold-deposited films also Raman-active lines of C2H4 appear in the IR-transmittance spectra. These lines saturate already below monolayer coverage. For C2H6 Raman bands like in SERS of C2H6 on cold-deposited silver are not observed. The appearance of the Raman lines of centrosymmetric molecules in the IR spectra is a first-layer effect and should be due to an indirect excitation mechanism involving metal electrons. For this mechanism roughness on an atomic scale and an adsorbate π* state are important.
Keywords :
Raman spectra; adsorbed layers; copper; infrared spectra; metallic thin films; monolayers; nanoparticles; surface plasmons; surface roughness; 293 to 298 K; Cu; Cu films; IR active vibrations; IR transmittance spectra; KBr; MgO; Raman active lines; Raman bands; cold deposited Cu films; electromagnetic field; metal nanoparticle films; nanostructured metal films; room temperature; surface enhanced infrared absorption; thin metal films; transparent substrates; ultra-high vacuum conditions; Crystals; Electromagnetic fields; Electromagnetic wave absorption; Infrared spectra; Nanobioscience; Optical films; Rough surfaces; Spectroscopy; Substrates; Surface roughness;
Conference_Titel :
Infrared and Millimeter Waves, 2004 and 12th International Conference on Terahertz Electronics, 2004. Conference Digest of the 2004 Joint 29th International Conference on
Print_ISBN :
0-7803-8490-3
DOI :
10.1109/ICIMW.2004.1422143