Title :
A multiclass extension of discriminant mappings
Author :
Aladjem, Mayer ; Dinstein, Its´Hak
Author_Institution :
Dept. of Electr. & Comput. Eng., Ben-Gurion Univ. of the Negev, Beer-Sheeva, Israel
fDate :
30 Aug-3 Sep 1992
Abstract :
Multiclass 2-D mapping oriented to classification of multivariate data is discussed. Parametric and nonparametric mapping criteria are used for single level (one shot) projections. A method for reducing the computation complexity of the optimization procedure is suggested
Keywords :
computational complexity; image recognition; optimisation; computation complexity; discriminant mappings; multiclass 2D mapping; multivariate data classification; nonparametric mapping; optimization; parametric mappings; pattern recognition; single level projection; Contracts; Covariance matrix; Extraterrestrial measurements; Optimization methods; Orbital robotics; Pattern recognition; Production management; Scattering; Space technology; Two dimensional displays;
Conference_Titel :
Pattern Recognition, 1992. Vol.II. Conference B: Pattern Recognition Methodology and Systems, Proceedings., 11th IAPR International Conference on
Conference_Location :
The Hague
Print_ISBN :
0-8186-2915-0
DOI :
10.1109/ICPR.1992.201731
