Title :
DC-to-mm-wave absolute potential measurements inside digital microwave ICs using a micromachined photoconductive sampling probe
Author :
David, G. ; Whitaker, J.F. ; Weatherford, T.R. ; Jobe, K. ; Meyer, S. ; Bustamante, M. ; Goyette, W. ; Thomas, S. ; Elliott, K.
Author_Institution :
Center for Ultrafast Opt. Sci., Michigan Univ., Ann Arbor, MI, USA
Abstract :
A micromachined photoconductive sampling probe is used to determine detailed wave forms at different circuit nodes and corresponding propagation delays from within an InP HBT frequency divider operating at 2.7 GHz. The results demonstrate for the first time the capability of photoconductive probes for absolute-voltage, DC-coupled potential measurements in integrated circuits.
Keywords :
III-V semiconductors; bipolar digital integrated circuits; frequency dividers; heterojunction bipolar transistors; indium compounds; integrated circuit measurement; micromachining; microwave frequency convertors; microwave integrated circuits; microwave measurement; photoconducting devices; voltage measurement; 2.7 GHz; DC-to-MM-wave absolute potential measurement; InP; InP HBT frequency divider; circuit node; digital microwave IC; micromachined photoconductive sampling probe; propagation delay; wave form; Aerospace electronics; Circuits; Microwave measurements; Optical sensors; Photoconducting devices; Photoconductivity; Probes; Sampling methods; Spatial resolution; Ultrafast optics;
Conference_Titel :
Microwave Symposium Digest, 1998 IEEE MTT-S International
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
0-7803-4471-5
DOI :
10.1109/MWSYM.1998.700620
