DocumentCode
305760
Title
Development of an automated via inspection station
Author
Romney, Todd ; Todd, Robert H.
Author_Institution
Nucl. Propulsion Program, United States Navy, USA
Volume
1
fYear
1996
fDate
6-9 Nov 1996
Firstpage
267
Abstract
To produce smaller, more compact circuit boards many companies are turning to low temperature co-fired ceramic substrate technology. Critical to the process is the location and alignment of small holes, or vias, which allow electrical conduction between the different layers of the circuit board. Inspection of the vias continues to be carried out manually by most manufacturers of these boards. This paper describes a Sr. Capstone project to automate the via inspection process and develop an automated via inspection station. Through research and experimentation it was found that camera resolution and magnification factor were two of the most critical requirements in developing an accurate via inspection station
Keywords
automatic optical inspection; cameras; circuit analysis computing; computer integrated manufacturing; electronic engineering education; printed circuit manufacture; substrates; Sr. Capstone project; automated via inspection station; camera resolution; compact circuit boards; companies; electrical conduction; low temperature co-fired ceramic substrate technology; magnification factor; small hole alignment; Cameras; Ceramics; Inspection; Manufacturing; Military computing; Printed circuits; Propulsion; Strontium; Substrates; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Frontiers in Education Conference, 1996. FIE '96. 26th Annual Conference., Proceedings of
Conference_Location
Salt Lake City, UT
ISSN
0190-5848
Print_ISBN
0-7803-3348-9
Type
conf
DOI
10.1109/FIE.1996.569959
Filename
569959
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