• DocumentCode
    3057935
  • Title

    THz time-domain spectroscopy of nanometric-thick gold layers

  • Author

    Garet, F. ; Duvillaret, L. ; Coutaz, J.-L.

  • Author_Institution
    Lab. of Microwaves & Characterization, Savoy Univ., Le Bourget du Lau, France
  • fYear
    2004
  • fDate
    27 Sept.-1 Oct. 2004
  • Firstpage
    467
  • Lastpage
    468
  • Abstract
    Using THz time-domain spectroscopy (THz TDS), we study the far infrared (0.1-1.8 THz) response of evaporated gold films whose thicknesses spread from 1.5 up to 30 nm. In this frequency domain, free carriers mainly dictate the optical properties of metallic materials. These ultra thin films are composed of islands that are in contact when the thickness is larger than a critical value, namely the percolation threshold, leading to a metallic response for those thicknesses. Well below this threshold, the islands are completely separated and no electric conduction is allowed: the films behave as dielectric layers. Around the critical thickness, percolation-type conductivity is observed. THz TDS permits to clearly observe these 3 regimes and to determine the complex refractive index of ultra thin gold layers in the far infrared.
  • Keywords
    dielectric thin films; discontinuous metallic thin films; frequency-domain analysis; gold; nanostructured materials; refractive index; submillimetre wave spectra; 0.1 to 1.8 THz; 1.5 to 30 nm; Au; THz time-domain spectroscopy; dielectric layers; evaporated gold films; far infrared response; free carriers; frequency domain analysis; metallic materials; nanometric thick gold layers; optical properties; percolation type conductivity; refractive index; ultra thin films; Conducting materials; Dielectric thin films; Frequency domain analysis; Gold; Infrared spectra; Optical films; Optical refraction; Optical variables control; Spectroscopy; Time domain analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Infrared and Millimeter Waves, 2004 and 12th International Conference on Terahertz Electronics, 2004. Conference Digest of the 2004 Joint 29th International Conference on
  • Print_ISBN
    0-7803-8490-3
  • Type

    conf

  • DOI
    10.1109/ICIMW.2004.1422166
  • Filename
    1422166