Title :
An algorithm for data-driven prognostics based on statistical analysis of condition monitoring data on a fleet level
Author :
Turrin, Simone ; Subbiah, Subanatarajan ; Leone, Giacomo ; Cristaldi, Loredana
Author_Institution :
Corp. Res. Center, Ind. Software & Applic., ABB AG, Ladenburg, Germany
Abstract :
The availability of condition monitoring data for large sets of homogeneous products (in the following referred as a fleet) motivates the development of new data-driven prognostic algorithms. In this paper, an intuitive and an innovative data-driven algorithm to predict the health and, consequently, the Residual Useful Lifetime (RUL) of a product are proposed. The algorithm is based on the extraction and exploitation of knowledge at a fleet level. The fleet-specific usage and the degradation profile are extracted by statistically analyzing the condition monitoring data of all the products that´s belongs to the fleet. The extracted knowledge, in terms of statistical distribution of health condition and sampling time, is then exploited to predict the health and RUL of a product in the fleet. The algorithm described in this paper is able to predict the RUL of a product with a good credibility even for observation window lengths that are smaller compared to the lifetime of the product.
Keywords :
condition monitoring; data analysis; knowledge acquisition; product life cycle management; product quality; remaining life assessment; sampling methods; statistical distributions; condition monitoring data analysis; condition monitoring data availability; data-driven prognostic algorithms; fleet-specific usage; health condition; homogeneous products; intuitive innovative data-driven algorithm; knowledge exploitation; knowledge extraction; product RUL; product lifetime; residual useful lifetime; sampling time; statistical distribution; Condition monitoring; Data mining; Degradation; Monitoring; Prediction algorithms; Reliability; condition monitoring data; data-driven prognostics; fleet; predictive maintenance;
Conference_Titel :
Instrumentation and Measurement Technology Conference (I2MTC), 2015 IEEE International
Conference_Location :
Pisa
DOI :
10.1109/I2MTC.2015.7151341