DocumentCode :
3058066
Title :
First order, quasi-static MOSFET bulk charge model showing inconsistencies in the BSIM power dissipation model
Author :
Sharma, Sameer ; Johnson, Louis G.
Author_Institution :
Dept. of Electr. & Comput. Eng., Trine Univ., IN, USA
fYear :
2009
fDate :
9-11 Dec. 2009
Firstpage :
1
Lastpage :
2
Abstract :
The accurate modeling of the MOSFET channel capacitance has evolved from Meyer´s reciprocal gate capacitive models to Ward´s charge-based, channel partition models. Numerous models have also been proposed to represent trans-capacitive and charging current components. Recently, a solution to separate the transport and charging current components for SOI MOSFET´s was proposed. The model also verified that Ward´s method of channel charge partitioning worked correctly as long as the charge had a linear dependence on the channel potential. This paper uses linear approximation on the first order power model for SOI MOSFET´s to include the BULK MOS transistors. There is a need to extend this work to include channel charge with nonlinear voltage dependence that does not generate extra power dissipation in the channel which has no physical basis.
Keywords :
MOSFET; approximation theory; capacitance; semiconductor device models; silicon-on-insulator; BSIM power dissipation model; SOI MOSFET; bulk MOS transistors; channel capacitance; channel charge partitioning; first order bulk charge model; first order power model; linear approximation; previous potential; quasistatic bulk charge model; reciprocal gate capacitive models; Capacitance; Charge transfer; Educational institutions; Energy conservation; Equations; Linear approximation; MOS devices; MOSFET circuits; Power MOSFET; Power dissipation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Device Research Symposium, 2009. ISDRS '09. International
Conference_Location :
College Park, MD
Print_ISBN :
978-1-4244-6030-4
Electronic_ISBN :
978-1-4244-6031-1
Type :
conf
DOI :
10.1109/ISDRS.2009.5378192
Filename :
5378192
Link To Document :
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